Structural and magnetic study of the influence of thickness on multilayer (Ni/NiO) deposits at room temperature

Abstract : The article describes a study on the influence of RF magnetron cathode sputter thickness, (09) Ni/NiO thin multilayer (each multilayer varies from 35 angstrom to 3000 angstrom). Measurements exploited by different MEB and XRD measurement techniques were obtained to give structural results and the average variation of the multilayer strength and the hysteresis cycles follow the two directions parallel and perpendicular to the substrate by VSM at room temperature. magnetic results.