Bridging nano- and microscale X-ray tomography for battery research by leveraging artificial intelligence

Jonathan Scharf , Mehdi Chouchane , Donal Finegan , Bingyu Lu , Christopher Redquest , Min-Cheol Kim , Weiliang Yao , Alejandro Franco (1) , Dan Gostovic , Zhao Liu (2) , Mark Riccio , František Zelenka , Jean-Marie Doux , Ying Shirley Meng (3)

1 LRCS - Laboratoire réactivité et chimie des solides - UMR CNRS 7314
2 IMR - Institute of Metal Research [Chinese Academy of Sciences]
3 Department of NanoEngineering

Domaines: Informatique [cs]; Intelligence artificielle [cs.AI]

Jonathan Scharf, Mehdi Chouchane, Donal Finegan, Bingyu Lu, Christopher Redquest, et al.. Bridging nano- and microscale X-ray tomography for battery research by leveraging artificial intelligence. Nature Nanotechnology, 2022, 17 (5), pp.446-459. ⟨10.1038/s41565-022-01081-9⟩. ⟨hal-03842593⟩