Khaled Kaja, Denis Mariolle, Nicolas Chevalier, Adnan Naja, Mustapha Jouiad. Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy.
Review of Scientific Instruments, American Institute of Physics, 2021, 92 (2),
⟨10.1063/5.0038335⟩.
⟨hal-03627683⟩